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Energy-dispersive X-ray spectroscopy ( EDS, EDX, EDXS or XEDS ), sometimes called energy dispersive X-ray analysis ( EDXA or EDAX) or energy dispersive X-ray microanalysis ( EDXMA ), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation ...
In electron microscopy an electron beam excites X-rays; there are two main techniques for analysis of spectra of characteristic X-ray radiation: energy-dispersive X-ray spectroscopy (EDS) and wavelength dispersive X-ray spectroscopy (WDS). In X-Ray Transmission (XRT), the equivalent atomic composition (Z eff) is captured based on photoelectric ...
Experimental electron energy loss spectrum, showing the major features: zero-loss peak, plasmon peaks and core loss edge. Electron energy loss spectroscopy ( EELS) is a form of electron microscopy in which a material is exposed to a beam of electrons with a known, narrow range of kinetic energies. Some of the electrons will undergo inelastic ...
X-ray fluorescence. XRF scanning of the Rembrandt -painting Syndics of the Drapers' Guild. A handheld XRF analyzer gun. X-ray fluorescence ( XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays.
M. von Ardenne's. A scanning electron microscope ( SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.
Inside the aberration corrector ( hexapole -hexapole type) A scanning transmission electron microscope ( STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen.
X-ray absorption near edge structure (XANES), also known as near edge X-ray absorption fine structure (NEXAFS), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected ...
An electron microprobe (EMP), also known as an electron probe microanalyzer (EPMA) or electron micro probe analyzer (EMPA), is an analytical tool used to non-destructively determine the chemical composition of small volumes of solid materials. It works similarly to a scanning electron microscope: the sample is bombarded with an electron beam ...