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Energy-dispersive X-ray spectroscopy ( EDS, EDX, EDXS or XEDS ), sometimes called energy dispersive X-ray analysis ( EDXA or EDAX) or energy dispersive X-ray microanalysis ( EDXMA ), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation ...
Silicon drift detector. Silicon drift detectors ( SDD s) are X-ray radiation detectors used in x-ray spectrometry ( XRF and EDS) and electron microscopy. Their chief characteristics compared with other X-ray detectors are: high count rates. comparatively high energy resolution (e.g. 125 eV for Mn Kα wavelength) Peltier cooling.
Energy-dispersive X-ray diffraction. Energy-dispersive X-ray diffraction ( EDXRD) is an analytical technique for characterizing materials. It differs from conventional X-ray diffraction by using polychromatic photons as the source and is usually operated at a fixed angle. [1] With no need for a goniometer, EDXRD is able to collect full ...
X-ray detector. Acquisition of projectional radiography, with an X-ray generator and an imaging detector. X-ray detectors are devices used to measure the flux, spatial distribution, spectrum, and/or other properties of X-rays . Detectors can be divided into two major categories: imaging detectors (such as photographic plates and X-ray film ...
Characteristic X-ray. Characteristic X-rays are emitted when outer- shell electrons fill a vacancy in the inner shell of an atom, releasing X-rays in a pattern that is "characteristic" to each element. Characteristic X-rays were discovered by Charles Glover Barkla in 1909, [1] who later won the Nobel Prize in Physics for his discovery in 1917.
In electron microscopy an electron beam excites X-rays; there are two main techniques for analysis of spectra of characteristic X-ray radiation: energy-dispersive X-ray spectroscopy (EDS) and wavelength dispersive X-ray spectroscopy (WDS). In X-Ray Transmission (XRT), the equivalent atomic composition (Z eff) is captured based on photoelectric ...
X-ray photoelectron spectroscopy ( XPS) is a surface-sensitive quantitative spectroscopic technique that measures the very topmost 200 atoms, 0.01 um, 10 nm of any surface. XPS is based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their ...
EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery. The change and sharpness of the electron backscatter patterns (EBSPs) provide information about lattice distortion in the diffracting ...